v3.04.100 SSLV100 - Cylindre creux en déformations planes#
Résumé:
Ce test permet de valider les éléments de déformation plane sur les fonctionnalités suivantes:
pression répartie,
matrice de rigidité,
déplacements imposés:
par degré de liberté,
par face d’élément.
Il comprend 4 modélisations.
Les 3 premières correspondent à des éléments de types différents (linéaires et quadratiques).
La dernière valide les déplacements imposés par face (blocage de la composante normale).
Solution de référence#
Méthode de calcul utilisée pour la solution de référence#
Analytique
\(\begin{array}{ccc}{\sigma}_{zz}& =& 2\nu P\frac{{a}^{2}}{{b}^{2}-{a}^{2}}\\ {\sigma}_{\mathrm{rr}}& =& P\frac{{a}^{2}}{{b}^{2}-{a}^{2}}\left[1-\frac{{b}^{2}}{{r}^{2}}\right]\\ {\sigma}_{\theta \theta }& =& P\frac{{a}^{2}}{{b}^{2}-{a}^{2}}\left[1+\frac{{b}^{2}}{{r}^{2}}\right]\\ {\sigma}_{r\theta }& =& 0\\ {u}_{r}& =& \frac{P}{E}\frac{{a}^{2}}{{b}^{2}-{a}^{2}}(1+\nu )\left[(1-2\nu )+\frac{{b}^{2}}{{r}^{2}}\right]r\end{array}\)
On obtient:
Pour \(r=0.1\) |
\({u}_{r}=5,72{10}^{-5}\) |
Pour \(r=0.2\) |
\({u}_{r}=3,64{10}^{-5}\) |
\({\sigma}_{\mathrm{rr}}=-60.\) |
\({\sigma}_{\mathrm{rr}}=0.\) |
||
\({\sigma}_{\theta \theta }=100.\) |
\({\sigma}_{\theta \theta }=40.\) |
||
\({\sigma}_{zz}=12.\) |
\({\sigma}_{zz}=12.\) |
||
\({\sigma}_{r\theta }=0.\) |
\({\sigma}_{r\theta }=0.\) |
Passage dans le système d’axes cartésiens:
\(\begin{array}{}{\sigma}_{xx}={\sigma}_{\mathrm{rr}}{\cos}^{2}\theta +{\sigma}_{\theta \theta }{\sin}^{2}\theta -2{\sigma}_{r\theta }\sin\theta \cos\theta \\ {\sigma}_{yy}={\sigma}_{\mathrm{rr}}{\sin}^{2}\theta +{\sigma}_{\theta \theta }{\cos}^{2}\theta +2{\sigma}_{r\theta }\sin\theta \cos\theta \\ {\sigma}_{xy}={\sigma}_{\mathrm{rr}}\sin\theta \cos\theta -{\sigma}_{\theta \theta }\sin\theta \cos\theta -2{\sigma}_{r\theta }({\cos}^{2}\theta -{\sin}^{2}\theta )\end{array}\)
avec:
\(\theta =0°\) aux points \(A\) et \(B\) ,
\(\theta =22.5°\) aux points \(C\) et \(D\) ,
\(\theta =45°\) aux points \(E\) et \(F\) .
Résultats de référence#
Déplacements \((u,v)\) et contraintes \(({\sigma}_{xx},{\sigma}_{yy},{\sigma}_{zz},{\sigma}_{xy})\) aux points \(A,B,C,D,E,F\) .
Références bibliographiques#
FUNG. Fundations of solid mechanics. Prentice-hall, inc. Englewood Cliffs. NJ. 1965 p.243 à 245.
Modélisation A#
Caractéristiques de la modélisation : d-plan (QUAD4 + TRIA3)#
Conditions limites: |
|
côté \(\mathrm{AB}\) |
DDL_IMPO = ( GROUP_NO = bordAB DY = 0. ) |
côté \(\mathrm{EF}\) |
FACE_IMPO = ( GROUP_MA = faceEF DNOR = 0. ) |
pression sur la face \(\mathrm{AE}\) |
PRES_REP = ( GROUP_MA = faceAE PRES = 60. ) |
Noms des nœuds: |
\(A=\mathrm{N23}\) |
\(B=\mathrm{N1}\) |
\(C=\mathrm{N391}\) |
\(D=\mathrm{N369}\) |
\(E=\mathrm{N451}\) |
\(F=751\) |
Caractéristiques du maillage#
Nombre de nœuds: 759
Nombre de mailles et types: 704 TRIA3, 352 QUAD4
Grandeurs testées et résultats#
Localisation |
Grandeur |
V aleur de r éférence |
Type de référence |
Tolérance |
point \(A\) |
||||
Champ DEPL, comp. \(X\) |
5.7210-5 |
“ANALYTIQUE” |
1% |
|
Champ DEPL, comp. \(Y\) |
“ANALYTIQUE” |
1E-10 (absolu) |
||
Champ SIGM_NOEU, comp. \(\mathit{SIXX}\) |
–60. |
“ANALYTIQUE” |
5% |
|
Champ SIGM_NOEU, comp. \(\mathit{SIYY}\) |
“ANALYTIQUE” |
5% |
||
Champ SIGM_NOEU, comp. \(\mathit{SIZZ}\) |
“ANALYTIQUE” |
5% |
||
Champ SIGM_NOEU, comp. \(\mathit{SIXY}\) |
“ANALYTIQUE” |
2 (absolu) |
||
\(B\) |
||||
Champ DEPL, comp. \(X\) |
3.6410-5 |
“ANALYTIQUE” |
1% |
|
Champ DEPL, comp. \(Y\) |
“ANALYTIQUE” |
1E-10 (absolu) |
||
Champ SIGM_NOEU, comp. \(\mathit{SIXX}\) |
“ANALYTIQUE” |
2 (absolu) |
||
Champ SIGM_NOEU, comp. \(\mathit{SIYY}\) |
“ANALYTIQUE” |
5% |
||
Champ SIGM_NOEU, comp. \(\mathit{SIZZ}\) |
“ANALYTIQUE” |
8% |
||
Champ SIGM_NOEU, comp. \(\mathit{SIXY}\) |
“ANALYTIQUE” |
1 (absolu) |
||
\(C\) |
||||
Champ DEPL, comp. \(X\) |
5.2845910–5 |
“ANALYTIQUE” |
1% |
|
Champ DEPL, comp. \(Y\) |
2.1889510–5 |
“ANALYTIQUE” |
1% |
|
Champ SIGM_NOEU, comp. \(\mathit{SIXX}\) |
-36.56854 |
“ANALYTIQUE” |
5% |
|
Champ SIGM_NOEU, comp. \(\mathit{SIYY}\) |
76.56854 |
“ANALYTIQUE” |
5% |
|
Champ SIGM_NOEU, comp. \(\mathit{SIZZ}\) |
“ANALYTIQUE” |
5% |
||
Champ SIGM_NOEU, comp. \(\mathit{SIXY}\) |
-56.56854 |
“ANALYTIQUE” |
5% |
|
\(D\) |
||||
Champ DEPL, comp. \(X\) |
3.3629210–5 |
“ANALYTIQUE” |
1% |
|
Champ DEPL, comp. \(Y\) |
1.3929710–5 |
“ANALYTIQUE” |
1% |
|
Champ SIGM_NOEU, comp. \(\mathit{SIXX}\) |
5.85786 |
“ANALYTIQUE” |
20% |
|
Champ SIGM_NOEU, comp. \(\mathit{SIYY}\) |
34.14214 |
“ANALYTIQUE” |
5% |
|
Champ SIGM_NOEU, comp. \(\mathit{SIZZ}\) |
“ANALYTIQUE” |
1% |
||
Champ SIGM_NOEU, comp. \(\mathit{SIXY}\) |
-14.14213 |
“ANALYTIQUE” |
8% |
|
\(E\) |
||||
Champ DEPL, comp. \(X\) |
4.0446510–5 |
“ANALYTIQUE” |
1% |
|
Champ DEPL, comp. \(Y\) |
4.0446510–5 |
“ANALYTIQUE” |
1% |
|
Champ SIGM_NOEU, comp. \(\mathit{SIXX}\) |
“ANALYTIQUE” |
5% |
||
Champ SIGM_NOEU, comp. \(\mathit{SIYY}\) |
“ANALYTIQUE” |
6% |
||
Champ SIGM_NOEU, comp. \(\mathit{SIZZ}\) |
“ANALYTIQUE” |
1% |
||
Champ SIGM_NOEU, comp. \(\mathit{SIXY}\) |
-80. |
“ANALYTIQUE” |
5% |
|
\(F\) |
“ANALYTIQUE” |
|||
Champ DEPL, comp. \(X\) |
2.5738710–5 |
“ANALYTIQUE” |
1% |
|
Champ DEPL, comp. \(Y\) |
2.5738710–5 |
“ANALYTIQUE” |
1% |
|
Champ SIGM_NOEU, comp. \(\mathit{SIXX}\) |
“ANALYTIQUE” |
7% |
||
Champ SIGM_NOEU, comp. \(\mathit{SIYY}\) |
“ANALYTIQUE” |
5% |
||
Champ SIGM_NOEU, comp. \(\mathit{SIZZ}\) |
“ANALYTIQUE” |
5% |
||
Champ SIGM_NOEU, comp. \(\mathit{SIXY}\) |
-20. |
“ANALYTIQUE” |
5% |
Remarques#
L’augmentation de l’erreur, quand on passe de \(\mathrm{AB}\) à \(\mathrm{CD}\) puis \(\mathrm{EF}\) , est imputable au maillage (densité en éléments QUAD4 inférieure à celle en TRIA3).
Modélisation B#
Caractéristiques de la modélisation : d-plan (QUAD8 + TRIA6)#
Conditions limites:
côté \(\mathrm{AB}\) |
DDL_IMPO = ( GROUP_NO = bordAB DY = 0. ) |
côté \(\mathrm{EF}\) |
FACE_IMPO = ( GROUP_MA = faceEF DNOR = 0. ) |
pression sur \(\mathrm{AE}\) |
PRES_REP = ( GROUP_MA = faceAE PRES = 60. ) |
Noms des nœuds: |
\(A=\mathrm{N2}\) |
\(B=\mathrm{N48}\) |
\(C=\mathrm{N401}\) |
\(D=\mathrm{N424}\) |
\(E=\mathrm{N606}\) |
\(F=\mathrm{N494}\) |
Caractéristiques du maillage#
Nombre de nœuds: 729
Nombre de mailles et types: 192 TRIA6, 96 QUAD8
Grandeurs testées et résultats#
Localisation |
Grandeur |
V aleur de r éférence |
Type de référence |
Tolérance |
point \(A\) |
||||
Champ DEPL, comp. \(Y\) |
5.7210-5 |
“ANALYTIQUE” |
1% |
|
Champ DEPL, comp. \(X\) |
“ANALYTIQUE” |
1E-10 (absolu) |
||
Maille M1 |
Champ SIGM_ELNO, comp. \(\mathit{SIXX}\) |
“ANALYTIQUE” |
1% |
|
Maille M2 |
Champ SIGM_ELNO, comp. \(\mathit{SIXX}\) |
“ANALYTIQUE” |
1% |
|
Maille M1 |
Champ SIGM_ELNO, comp. \(\mathit{SIYY}\) |
-60. |
“ANALYTIQUE” |
1% |
Maille M2 |
Champ SIGM_ELNO, comp. \(\mathit{SIYY}\) |
-60. |
“ANALYTIQUE” |
1% |
Maille M1 |
Champ SIGM_ELNO, comp. \(\mathit{SIZZ}\) |
“ANALYTIQUE” |
2% |
|
Maille M2 |
Champ SIGM_ELNO, comp. \(\mathit{SIZZ}\) |
“ANALYTIQUE” |
2% |
|
Maille M1 |
Champ SIGM_ELNO, comp. \(\mathit{SIXY}\) |
“ANALYTIQUE” |
0,5(absolu) |
|
Maille M2 |
Champ SIGM_ELNO, comp. \(\mathit{SIXY}\) |
“ANALYTIQUE” |
0,5(absolu) |
|
\(B\) |
||||
Champ DEPL, comp. \(Y\) |
3.6410-5 |
“ANALYTIQUE” |
1% |
|
Champ DEPL, comp. \(X\) |
“ANALYTIQUE” |
1E-10(absolu) |
||
Maille M23 |
Champ SIGM_ELNO, comp. \(\mathit{SIXX}\) |
“ANALYTIQUE” |
1% |
|
Maille M24 |
Champ SIGM_ELNO, comp. \(\mathit{SIXX}\) |
“ANALYTIQUE” |
1% |
|
Maille M23 |
Champ SIGM_ELNO, comp. \(\mathit{SIYY}\) |
“ANALYTIQUE” |
0,5 (absolu) |
|
Maille M24 |
Champ SIGM_ELNO, comp. \(\mathit{SIYY}\) |
“ANALYTIQUE” |
0,5 (absolu) |
|
Maille M23 |
Champ SIGM_ELNO, comp. \(\mathit{SIZZ}\) |
“ANALYTIQUE” |
1% |
|
Maille M24 |
Champ SIGM_ELNO, comp. \(\mathit{SIZZ}\) |
“ANALYTIQUE” |
1% |
|
Maille M23 |
Champ SIGM_ELNO, comp. \(\mathit{SIXY}\) |
“ANALYTIQUE” |
0,5(absolu) |
|
Maille M24 |
Champ SIGM_ELNO, comp. \(\mathit{SIXY}\) |
“ANALYTIQUE” |
0,5(absolu) |
|
\(C\) |
||||
Champ DEPL, comp. \(Y\) |
5.2845910–5 |
“ANALYTIQUE” |
1% |
|
Champ DEPL, comp. \(X\) |
2.1889510–5 |
“ANALYTIQUE” |
1% |
|
Maile M169 |
Champ SIGM_ELNO, comp. \(\mathit{SIXX}\) |
76.56854 |
“ANALYTIQUE” |
1% |
Maile M170 |
Champ SIGM_ELNO, comp. \(\mathit{SIXX}\) |
76.56854 |
“ANALYTIQUE” |
1% |
Maile M193 |
Champ SIGM_ELNO, comp. \(\mathit{SIXX}\) |
76.56854 |
“ANALYTIQUE” |
1% |
Maile M169 |
Champ SIGM_ELNO, comp. \(\mathit{SIYY}\) |
-36.56854 |
“ANALYTIQUE” |
2% |
Maile M170 |
Champ SIGM_ELNO, comp. \(\mathit{SIYY}\) |
-36.56854 |
“ANALYTIQUE” |
2% |
Maile M193 |
Champ SIGM_ELNO, comp. \(\mathit{SIYY}\) |
-36.56854 |
“ANALYTIQUE” |
2% |
Maile M169 |
Champ SIGM_ELNO, comp. \(\mathit{SIZZ}\) |
“ANALYTIQUE” |
5% |
|
Maile M170 |
Champ SIGM_ELNO, comp. \(\mathit{SIZZ}\) |
“ANALYTIQUE” |
5% |
|
Maile M193 |
Champ SIGM_ELNO, comp. \(\mathit{SIZZ}\) |
“ANALYTIQUE” |
5% |
|
Maile M169 |
Champ SIGM_ELNO, comp. \(\mathit{SIXY}\) |
56.56854 |
“ANALYTIQUE” |
1% |
Maile M170 |
Champ SIGM_ELNO, comp. \(\mathit{SIXY}\) |
56.56854 |
“ANALYTIQUE” |
1% |
Maile M193 |
Champ SIGM_ELNO, comp. \(\mathit{SIXY}\) |
56.56854 |
“ANALYTIQUE” |
1% |
\(D\) |
||||
Champ DEPL, comp. \(Y\) |
3.3629210–5 |
“ANALYTIQUE” |
1% |
|
Champ DEPL, comp. \(X\) |
1.3929710–5 |
“ANALYTIQUE” |
1% |
|
Maille M190 |
Champ SIGM_ELNO, comp. \(\mathit{SIXX}\) |
34.14214 |
“ANALYTIQUE” |
1% |
Maille M192 |
Champ SIGM_ELNO, comp. \(\mathit{SIXX}\) |
34.14214 |
“ANALYTIQUE” |
1% |
Maille M204 |
Champ SIGM_ELNO, comp. \(\mathit{SIXX}\) |
34.14214 |
“ANALYTIQUE” |
1% |
Maille M190 |
Champ SIGM_ELNO, comp. \(\mathit{SIYY}\) |
5.85786 |
“ANALYTIQUE” |
5% |
Maille M192 |
Champ SIGM_ELNO, comp. \(\mathit{SIYY}\) |
5.85786 |
“ANALYTIQUE” |
5% |
Maille M204 |
Champ SIGM_ELNO, comp. \(\mathit{SIYY}\) |
5.85786 |
“ANALYTIQUE” |
5% |
Maille M190 |
Champ SIGM_ELNO, comp. \(\mathit{SIZZ}\) |
“ANALYTIQUE” |
1% |
|
Maille M192 |
Champ SIGM_ELNO, comp. \(\mathit{SIZZ}\) |
“ANALYTIQUE” |
1% |
|
Maille M204 |
Champ SIGM_ELNO, comp. \(\mathit{SIZZ}\) |
“ANALYTIQUE” |
1% |
|
Maille M190 |
Champ SIGM_ELNO, comp. \(\mathit{SIXY}\) |
14.14213 |
“ANALYTIQUE” |
1% |
Maille M192 |
Champ SIGM_ELNO, comp. \(\mathit{SIXY}\) |
14.14213 |
“ANALYTIQUE” |
1% |
Maille M204 |
Champ SIGM_ELNO, comp. \(\mathit{SIXY}\) |
14.14213 |
“ANALYTIQUE” |
1% |
\(E\) |
||||
Champ DEPL, comp. \(Y\) |
4.0446510–5 |
“ANALYTIQUE” |
1% |
|
Champ DEPL, comp. \(X\) |
-4.0446510–5 |
“ANALYTIQUE” |
1% |
|
Maille M256 |
Champ SIGM_ELNO, comp. \(\mathit{SIXX}\) |
“ANALYTIQUE” |
5% |
|
Maille M256 |
Champ SIGM_ELNO, comp. \(\mathit{SIYY}\) |
“ANALYTIQUE” |
5% |
|
Maille M256 |
Champ SIGM_ELNO, comp. \(\mathit{SIZZ}\) |
“ANALYTIQUE” |
5% |
|
Maille M256 |
Champ SIGM_ELNO, comp. \(\mathit{SIXY}\) |
“ANALYTIQUE” |
1% |
|
\(F\) |
“ANALYTIQUE” |
|||
Champ DEPL, comp. \(Y\) |
2.5738710–5 |
“ANALYTIQUE” |
1% |
|
Champ DEPL, comp. \(X\) |
-2.5738710–5 |
“ANALYTIQUE” |
1% |
|
Maille M222 |
Champ SIGM_ELNO, comp. \(\mathit{SIXX}\) |
“ANALYTIQUE” |
1% |
|
Maille M222 |
Champ SIGM_ELNO, comp. \(\mathit{SIYY}\) |
“ANALYTIQUE” |
1% |
|
Maille M222 |
Champ SIGM_ELNO, comp. \(\mathit{SIZZ}\) |
“ANALYTIQUE” |
1% |
|
Maille M222 |
Champ SIGM_ELNO, comp. \(\mathit{SIXY}\) |
“ANALYTIQUE” |
1% |
Remarques#
L’évolution de l’erreur induite par le maillage suivant \(\mathrm{AB}\) , \(\mathrm{CD}\) ou \(\mathrm{EF}\) , est nettement atténuée par rapport à la modélisation A.
Modélisation C#
Caractéristiques de la modélisation : d-plan (QUAD9)#
Conditions limites:
côté \(\mathrm{AB}\) |
DDL_IMPO = ( GROUP_NO = bordAB DY = 0. ) |
côté \(\mathrm{EF}\) |
FACE_IMPO = ( GROUP_MA = faceEF DNOR = 0. ) |
pression sur \(\mathrm{AE}\) |
PRES_REP = ( GROUP_MA = faceAE PRES = 60. ) |
Noms des nœuds: |
\(A=\mathrm{N1}\) |
\(B=\mathrm{N47}\) |
\(C=\mathrm{N351}\) |
\(D=\mathrm{N374}\) |
\(E=\mathrm{N569}\) |
\(F=\mathrm{N423}\) |
Caractéristiques du maillage#
Nombre de nœuds: 725
Nombre de mailles et types: 168 QUAD9
Grandeurs testées et résultats#
Localisation |
Grandeur |
V aleur de r éférence |
Type de référence |
Tolérance |
point \(A\) |
||||
Champ DEPL, comp. \(X\) |
5.7210-5 |
“ANALYTIQUE” |
1% |
|
Champ DEPL, comp. \(Y\) |
“ANALYTIQUE” |
1E-10 (absolu) |
||
Maille M1 |
Champ SIGM_ELNO, comp. \(\mathit{SIXX}\) |
–60. |
“ANALYTIQUE” |
1% |
Maille M1 |
Champ SIGM_ELNO, comp. \(\mathit{SIYY}\) |
“ANALYTIQUE” |
1% |
|
Maille M1 |
Champ SIGM_ELNO, comp. \(\mathit{SIZZ}\) |
“ANALYTIQUE” |
5% |
|
Maille M1 |
Champ SIGM_ELNO, comp. \(\mathit{SIXY}\) |
“ANALYTIQUE” |
1E-2(absolu) |
|
\(B\) |
||||
Champ DEPL, comp. \(X\) |
3.6410-5 |
“ANALYTIQUE” |
1% |
|
Champ DEPL, comp. \(Y\) |
“ANALYTIQUE” |
1E-10 (absolu) |
||
Maille M12 |
Champ SIGM_ELNO, comp. \(\mathit{SIXX}\) |
“ANALYTIQUE” |
0,1(absolu) |
|
Maille M12 |
Champ SIGM_ELNO, comp. \(\mathit{SIYY}\) |
“ANALYTIQUE” |
1% |
|
Maille M12 |
Champ SIGM_ELNO, comp. \(\mathit{SIZZ}\) |
“ANALYTIQUE” |
1% |
|
Maille M12 |
Champ SIGM_ELNO, comp. \(\mathit{SIXY}\) |
“ANALYTIQUE” |
1E-2(absolu) |
|
\(C\) |
||||
Champ DEPL, comp. \(X\) |
5.2845910–5 |
“ANALYTIQUE” |
1% |
|
Champ DEPL, comp. \(Y\) |
2.1889510–5 |
“ANALYTIQUE” |
1% |
|
Maille M73 |
Champ SIGM_ELNO, comp. \(\mathit{SIXX}\) |
-36.56854 |
“ANALYTIQUE” |
2% |
Maille M85 |
Champ SIGM_ELNO, comp. \(\mathit{SIXX}\) |
-36.56854 |
“ANALYTIQUE” |
2% |
Maille M73 |
Champ SIGM_ELNO, comp. \(\mathit{SIYY}\) |
76.56854 |
“ANALYTIQUE” |
1% |
Maille M85 |
Champ SIGM_ELNO, comp. \(\mathit{SIYY}\) |
76.56854 |
“ANALYTIQUE” |
1% |
Maille M73 |
Champ SIGM_ELNO, comp. \(\mathit{SIZZ}\) |
“ANALYTIQUE” |
3% |
|
Maille M85 |
Champ SIGM_ELNO, comp. \(\mathit{SIZZ}\) |
“ANALYTIQUE” |
3% |
|
Maille M73 |
Champ SIGM_ELNO, comp. \(\mathit{SIXY}\) |
-56.56854 |
“ANALYTIQUE” |
1% |
Maille M85 |
Champ SIGM_ELNO, comp. \(\mathit{SIXY}\) |
-56.56854 |
“ANALYTIQUE” |
1% |
\(D\) |
||||
Champ DEPL, comp. \(X\) |
3.3629210–5 |
“ANALYTIQUE” |
1% |
|
Champ DEPL, comp. \(Y\) |
1.3929710–5 |
“ANALYTIQUE” |
1% |
|
Maille M84 |
Champ SIGM_ELNO, comp. \(\mathit{SIXX}\) |
5.85786 |
“ANALYTIQUE” |
2% |
Maille M96 |
Champ SIGM_ELNO, comp. \(\mathit{SIXX}\) |
5.85786 |
“ANALYTIQUE” |
2% |
Maille M84 |
Champ SIGM_ELNO, comp. \(\mathit{SIYY}\) |
34.14214 |
“ANALYTIQUE” |
1% |
Maille M96 |
Champ SIGM_ELNO, comp. \(\mathit{SIYY}\) |
34.14214 |
“ANALYTIQUE” |
1% |
Maille M84 |
Champ SIGM_ELNO, comp. \(\mathit{SIZZ}\) |
“ANALYTIQUE” |
1% |
|
Maille M96 |
Champ SIGM_ELNO, comp. \(\mathit{SIZZ}\) |
“ANALYTIQUE” |
1% |
|
Maille M84 |
Champ SIGM_ELNO, comp. \(\mathit{SIXY}\) |
-14.14213 |
“ANALYTIQUE” |
1% |
Maille M96 |
Champ SIGM_ELNO, comp. \(\mathit{SIXY}\) |
-14.14213 |
“ANALYTIQUE” |
1% |
\(E\) |
||||
Champ DEPL, comp. \(X\) |
4.0446510–5 |
“ANALYTIQUE” |
1% |
|
Champ DEPL, comp. \(Y\) |
4.0446510–5 |
“ANALYTIQUE” |
1% |
|
Maille M136 |
Champ SIGM_ELNO, comp. \(\mathit{SIXX}\) |
“ANALYTIQUE” |
3% |
|
Maille M136 |
Champ SIGM_ELNO, comp. \(\mathit{SIYY}\) |
“ANALYTIQUE” |
3% |
|
Maille M136 |
Champ SIGM_ELNO, comp. \(\mathit{SIZZ}\) |
“ANALYTIQUE” |
3% |
|
Maille M136 |
Champ SIGM_ELNO, comp. \(\mathit{SIXY}\) |
-80. |
“ANALYTIQUE” |
1% |
\(F\) |
“ANALYTIQUE” |
|||
Champ DEPL, comp. \(X\) |
2.5738710–5 |
“ANALYTIQUE” |
1% |
|
Champ DEPL, comp. \(Y\) |
2.5738710–5 |
“ANALYTIQUE” |
1% |
|
Maille M102 |
Champ SIGM_ELNO, comp. \(\mathit{SIXX}\) |
“ANALYTIQUE” |
1% |
|
Maille M102 |
Champ SIGM_ELNO, comp. \(\mathit{SIYY}\) |
“ANALYTIQUE” |
1% |
|
Maille M102 |
Champ SIGM_ELNO, comp. \(\mathit{SIZZ}\) |
“ANALYTIQUE” |
1% |
|
Maille M102 |
Champ SIGM_ELNO, comp. \(\mathit{SIXY}\) |
-20. |
“ANALYTIQUE” |
1% |
Remarques#
L’évolution de l’erreur induite par le maillage suivant \(\mathrm{AB}\) , \(\mathrm{CD}\) ou \(\mathrm{EF}\) , est nettement atténuée par rapport à la modélisation A.
Modélisation D#
Caractéristiques de la modélisation : d-plan (QUAD4 + TRIA3)#
Conditions limites:
côté \(\mathrm{AB}\) |
DDL_IMPO : (GROUP_NO = bordAB DY = 0. ) |
côté \(\mathrm{EF}\) |
FACE_IMPO : (GROUP_MA = faceEF DNOR = 0.) |
sur |
déplacement normal imposé à \(5.72E-5m\) |
FACE_IMPO : (GROUP_MA = faceAE DNOR = -5.72 E-5) |
Noms des nœuds: |
\(A=\mathrm{N23}\) |
\(B=\mathrm{N1}\) |
\(C=\mathrm{N391}\) |
\(D=\mathrm{N369}\) |
\(E=\mathrm{N451}\) |
\(F=\mathrm{N751}\) |
|
\(H=\mathrm{N92}\) |
\(G=\mathrm{N447}\) |
Caractéristiques du maillage#
Nombre de noeuds: 759
Nombre de mailles et types: 704 TRIA3, 352 QUAD4
Grandeurs testées et résultats#
Localisation |
Grandeur |
Valeur de r éférence |
Type de référence |
Tolérance |
\(C\) |
Champ REAC_NODA, comp FX |
0.1360 |
‘NON_DEFINI’ |
3,5% |
Champ REAC_NODA, comp FY |
0.056 |
‘NON_DEFINI’ |
4,1% |
|
\(H\) |
Champ REAC_NODA, comp FX |
0.14686 |
‘NON_DEFINI’ |
7,4% |
Champ REAC_NODA, comp FY |
0.0108 |
‘NON_DEFINI’ |
7,1% |
|
\(G\) |
Champ REAC_NODA, comp FX |
0.1138 |
‘NON_DEFINI’ |
0,3% |
Champ REAC_NODA, comp FY |
0.093 |
‘NON_DEFINI’ |
0,7% |
Remarques#
On vérifie que les forces nodales de réaction sont nulles en tous les nœuds, sauf sur les nœuds de la ligne \(\mathrm{AE}\) , \(\mathrm{EF}\) et \(\mathrm{AB}\) .
Synthèse des résultats#
D_plan
modélisation |
||||
Récapitulatif des erreurs max en % |
A |
B |
C |
|
Déplacements |
A, B C, D E, F |
0.08 0.51 0.11 |
0.04 0.04 0.04 |
0.05 0.05 0.05 |
Contraintes \({\sigma}_{xx}\) |
A, B C, D E, F |
6.04 10.84 17.46 |
0.29 0.17 4.10–4 |
0.27 0.32 2.10–4 |
Contraintes \({\sigma}_{yy}\) |
A, B C, D E, F |
3.61 0.72 27.07 |
0.38 0.63 2.10–5 |
0.16 0.14 5.5.10–4 |
Contraintes \({\sigma}_{zz}\) |
A, B C, D E, F |
1.33 8.51 22.27 |
0.16 0.63 2.10–4 |
0.02 0.02 2.10–4 |
Contraintes \({\sigma}_{xy}\) |
A, B C, D E, F |
4.99 2.11 |
0.50 0.23 |
0.2 0.2 |
Ces 3 modélisations ont sensiblement le même nombre de nœuds; les résultats obtenus avec des éléments d’ordre 1 (modélisation A en TRIA3 et QUAD4) sont nettement moins précis, notamment sur la paroi interne.